BIST Design For Static Neighbourhood Pattern Sensitive Fault Test
نویسندگان
چکیده
Traditional tests for memories are based on conventional fault models, involving the address decoder, individual memory cells and a limited coupling between them. Built-in self-test (BIST) solutions for testing memories today incorporate hardware for test pattern generation and application for a variety of the algorithms. The NPSF fault model is recognized as a high quality fault model for memory arrays, the excessive test algorithm time cost associated with it, compared to other fault models, restricts its adoption for memory testing. These faults are of different classes and types. More specifically, active, passive and static faults for distance 1 and 2 neighborhoods, of types 1 and 2, are considered. This paper presents a BIST implementation using cellular automata (CA) for detection of static neighborhood pattern sensitive faults (SNPSFs) in random access memories (RAMs).
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